the entire directory only in Products_and_Services/Instruments

See also:

• Business: Industrial Goods and Services: Calibration and Testing: Equipment (19)
• Business: Industrial Goods and Services: Machinery and Tools: Test Equipment (139)
• Science: Instruments and Supplies: Laboratory Equipment (1,536)

• Area Detector Systems Corporation - Manufacturer of CCD detectors, particularly in the x-ray range. Includes specifications, certification and technical support from Poway, California.
• Axic, Inc. - Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California.
• Dacell Co., Ltd. - Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea.
• InsituTec - Nanotechnology company providing macro-metrology products for measuring large scale parts with micro to nanometer accuracies and micro-metrology products with sensors based on standing wave technology.
• LumaSense Technologies AS - Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, contacts in Europe and headquarters in Santa Clara, California
• Molecular Metrology, Inc. - Designs and manufactures x-ray scattering equipment, including complete instruments for small angle mode and two dimensional detectors. Includes specifications of systems and components, at Northampton, Massachusetts.
• Oxford Microbeams Ltd. - Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.
• Physical Electronics, Inc. - Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation.

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